Kavousianos, X.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Optimal Selective Huffman Coding for Test-Data Compression

Kavousianos, X., Kalligeros, E., Nikolos, D.

Journal:

IEEE Transactions on Computers

Year:

2007

Language:

english

File:

PDF, 1.65 MB

english, 2007

2

[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs

Tenentes, Vasileios, Kavousianos, Xrysovalantis

Year:

2011

Language:

english

File:

PDF, 768 KB

english, 2011

3

[IEEE ISCAS 2003. International Symposium on Circuits and Systems - Bangkok, Thailand (25-28 May 2003)] Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03. - Virtual-scan: a novel approach for software-based self-testing of microprocessors

Dimitrakopoulos, G., Kavousianos, X., Nikolos, D.

Year:

2003

Language:

english

File:

PDF, 284 KB

english, 2003

4

[IEEE 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09) - Nice (2009.04.20-2009.04.24)] 2009 Design, Automation & Test in Europe Conference & Exhibition - LFSR-based test-data compression with self-stoppable seeds

Koutsoupia, M., Kalligeros, E., Kavousianos, X., Nikolos, D.

Year:

2009

Language:

english

File:

PDF, 284 KB

english, 2009

5

New efficient totally self-checking Berger code checkers

X. Kavousianos, D. Nikolos, G. Foukarakis, T. Gnardellis

Journal:

Integration, the VLSI Journal

Year:

1999

Language:

english

File:

PDF, 362 KB

english, 1999

6

On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST

Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 299 KB

english, 2002

7

Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects

Kavousianos, X., Chakrabarty, K.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2011

Language:

english

File:

PDF, 336 KB

english, 2011

8

Multiphase BIST: a new reseeding technique for high test-data compression

Kalligeros, E., Kavousianos, X., Nikolos, D.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2004

Language:

english

File:

PDF, 791 KB

english, 2004

9

Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability

Kavousianos, X., Kalligeros, E., Nikolos, D.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2008

Language:

english

File:

PDF, 430 KB

english, 2008

10

Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores

Tenentes, V., Kavousianos, X., Kalligeros, E.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2010

Language:

english

File:

PDF, 570 KB

english, 2010

11

A new built-in TPG method for circuits with random pattern resistant faults

Kavousianos, X., Bakalis, D., Nikolos, D., Tragoudas, S.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2002

Language:

english

File:

PDF, 376 KB

english, 2002

12

[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - Novel single and double output TSC Berger code checkers

Kavousianos, X., Nikolos, D.

Year:

1998

Language:

english

File:

PDF, 355 KB

english, 1998

13

Static Power Reduction Using Variation-Tolerant and Reconfigurable Multi-Mode Power Switches

Zhang, Zhaobo, Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Tsiatouhas, Yiorgos

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2014

Language:

english

File:

PDF, 2.11 MB

english, 2014

14

Test Schedule Optimization for Multicore SoCs: Handling Dynamic Voltage Scaling and Multiple Voltage Islands

Kavousianos, X., Chakrabarty, K., Jain, A., Parekhji, R.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2012

Language:

english

File:

PDF, 3.40 MB

english, 2012

15

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Defect aware X-filling for low-power scan testing

Balatsouka, S, Tenentes, V, Kavousianos, X, Chakrabarty, K

Year:

2010

Language:

english

File:

PDF, 263 KB

english, 2010

16

[IEEE 2010 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Lixouri, Greece (2010.07.5-2010.07.7)] 2010 IEEE Computer Society Annual Symposium on VLSI - Self-Freeze Linear Decompressors for Low Power Testing

Tenentes, V., Kavousianos, X.

Year:

2010

Language:

english

File:

PDF, 447 KB

english, 2010

17

The Time Dilation Technique for Timing Error Tolerance

Valadimas, Stefanos, Floros, Andreas, Tsiatouhas, Yiorgos, Arapoyanni, Angela, Kavousianos, Xrysovalantis

Journal:

IEEE Transactions on Computers

Year:

2014

Language:

english

File:

PDF, 442 KB

english, 2014

18

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Defect Coverage-Driven Window-Based Test Compression

Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Kalligeros, Emmanouil, Tenentes, Vasileios

Year:

2010

Language:

english

File:

PDF, 406 KB

english, 2010

19

High-Quality Statistical Test Compression With Narrow ATE Interface

Tenentes, Vasileios, Kavousianos, Xrysovalantis

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 804 KB

english, 2013

20

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Signature Analysis for Testing, Diagnosis, and Repair of Multi-mode Power Switches

Zhang, Zhaobo, Kavousianos, Xrysovalantis, Luo, Yan, Tsiatouhas, Yiorgos, Chakrabarty, Krishnendu

Year:

2011

Language:

english

File:

PDF, 255 KB

english, 2011

21

[IEEE Comput. Soc Eleventh Asian Test Symposium - Guam, USA (18-20 Nov. 2002)] Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). - A ROMless LFSR reseeding scheme for scan-based BIST

Kalligeros, E., Kavousianos, X., Nikolos, D.

Year:

2002

File:

PDF, 888 KB

2002

22

[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Self-exercising self testing k-order comparators

Kavousianos, X., Nikolos, D.

Year:

1997

Language:

english

File:

PDF, 566 KB

english, 1997

23

Kavousianos, Xrysovalantis, Tenentes, Vasileios, Chakrabarty, Krishnendu, Kalligeros, Emmanouil

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2011

Language:

english

File:

PDF, 360 KB

english, 2011

24

[IEEE 2011 24th International Conference on VLSI Design: concurrently with the 10th International Conference on Embedded Systems Design - Chennai (2011.01.2-2011.01.7)] 2011 24th Internatioal Conference on VLSI Design - A Robust and Reconfigurable Multi-mode Power Gating Architecture

Zhang, Z, Kavousianos, X, Chakrabarty, K, Tsiatouhas, Y

Year:

2011

Language:

english

File:

PDF, 465 KB

english, 2011

25

[IEEE Comput. Soc Seventh International On-Line Testing Workshop. IOLTW 2001 - Taormina, Italy (9-11 July 2001)] Proceedings Seventh International On-Line Testing Workshop - On the design of self-testing checkers for modified Berger codes

Piestrak, S.J., Bakalis, D., Kavousianos, X.

Year:

2001

Language:

english

File:

PDF, 451 KB

english, 2001

26

[IEEE 7th International Symposium on Quality Electronic Design (ISQED'06) - San Jose, CA, USA (27-29 March 2006)] 7th International Symposium on Quality Electronic Design (ISQED'06) - Efficient Multiphase Test Set Embedding for Scan-based Testing

Kalligeros, E., Kavousianos, X., Nikolos, D.

Year:

2006

Language:

english

File:

PDF, 238 KB

english, 2006

27

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Low Power Test-Compression for High Test-Quality and Low Test-Data Volume

Tenentes, Vasileios, Kavousianos, Xrysovalantis

Year:

2011

Language:

english

File:

PDF, 660 KB

english, 2011

28

[IEEE 2005 12th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2005) - Gammarth (2005.12.11-2005.12.14)] 2005 12th IEEE International Conference on Electronics, Circuits and Systems - Power aware test-data compression for scan-based testing

Gekas, G., Nikolos, D., Kalligeros, E., Kavousianos, X.

Year:

2005

Language:

english

File:

PDF, 944 KB

english, 2005

29

[IEEE Comput. Soc IEEE 2001 2nd International Symposium on Quality Electronic Design. IEEE ISQED 2001 - San Jose, CA, USA (26-28 March 2001)] Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design - On accumulator-based bit-serial test response compaction schemes

Bakalis, D., Nikolos, D., Vergos, H.T., Kavousianos, X.

Year:

2001

Language:

english

File:

PDF, 594 KB

english, 2001

30

[IEEE Comput. Soc 2002 3rd International Symposium on Quality Electronic Design - San Jose, CA, USA (18-21 March 2002)] Proceedings International Symposium on Quality Electronic Design - An efficient seeds selection method for LFSR-based test-per-clock BIST

Kalligeros, E., Kavousianos, X., Bakalis, D., Nikolos, D.

Year:

2002

Language:

english

File:

PDF, 288 KB

english, 2002

31

[IEEE Comput. Soc Seventh International On-Line Testing Workshop. IOLTW 2001 - Taormina, Italy (9-11 July 2001)] Proceedings Seventh International On-Line Testing Workshop - New reseeding technique for LFSR-based test pattern generation

Kalligeros, E., Kavousianos, X., Bakalis, D., Nikolos, D.

Year:

2001

Language:

english

File:

PDF, 633 KB

english, 2001

32

[IEEE Comput. Soc IEEE Computer Society Annual Symposium on VLSI - Lafayette, LA, USA (19-20 Feb. 2004)] IEEE Computer Society Annual Symposium on VLSI - An efficient test vector ordering method for low power testing

Kavousianos, X., Bakalis, D., Bellos, M., Nikolos, D.

Year:

2004

File:

PDF, 545 KB

2004

33

[IEEE 1999 Southwest Symposium on Mixed-Signal Design - Tucson, AZ, USA (11-13 April 1999)] 1999 Southwest Symposium on Mixed-Signal Design (Cat. No.99EX286) - On-chip deterministic counter-based TPG with low heat dissipation

Kavousianos, X., Nikolos, D., Tragoudas, S.

Year:

1999

Language:

english

File:

PDF, 593 KB

english, 1999

34

[IEEE 2014 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Santorini, Greece (2014.5.6-2014.5.8)] 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Recent advances in single- and multi-site test optimization for DVS-based SoCs

Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu

Year:

2014

Language:

english

File:

PDF, 437 KB

english, 2014

35

Built-In Self-Test, Diagnosis, and Repair of MultiMode Power Switches

Wang, Ran, Zhang, Zhaobo, Kavousianos, Xrysovalantis, Tsiatouhas, Yiorgos, Chakrabarty, Krishnendu

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2014

Language:

english

File:

PDF, 1.41 MB

english, 2014

36

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - A BIST scheme for testing and repair of multi-mode power switches

Zhang, Zhaobo, Kavousianos, Xrysovalantis, Tsiatouhas, Yiorgos, Chakrabarty, Krishnendu

Year:

2011

Language:

english

File:

PDF, 493 KB

english, 2011

37

Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains

Kavousianos, Xrysovalantis, Kalligeros, Emmanouil, Nikolos, Dimitris

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2008

Language:

english

File:

PDF, 433 KB

english, 2008

38

[IEEE Comput. Soc 5th International Symposium on Quality Electronic Design - San Jose, CA, USA (22-24 March 2004)] SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720) - Low power testing by test vector ordering with vector repetition

Bellos, M., Bakalis, D., Nikolos, D., Kavousianos, X.

Year:

2004

Language:

english

File:

PDF, 259 KB

english, 2004

39

Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores

Kavousianos, Xrysovalantis, Kalligeros, Emmanouil, Nikolos, Dimitris

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2007

Language:

english

File:

PDF, 539 KB

english, 2007

40

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Multi-site test optimization for multi-Vdd SoCs using space- and time- division multiplexing

Vartziotis, Fotis, Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Parekhji, Rubin, Jain, Arvind

Year:

2014

Language:

english

File:

PDF, 590 KB

english, 2014

41

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Testing for SoCs with Advanced Static and Dynamic Power-Management Capabilities

Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu

Year:

2013

Language:

english

File:

PDF, 456 KB

english, 2013

42

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Test Scheduling for Multicore SoCs with Dynamic Voltage Scaling and Multiple Voltage Islands

Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Jain, Arvind, Parekhji, Rubin

Year:

2011

Language:

english

File:

PDF, 213 KB

english, 2011

43

[IEEE Comput. Soc 17th IEEE VLSI Test Symposium - Dana Point, CA, USA (25-29 April 1999)] Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) - Modular TSC checkers for Bose-Lin and Bose codes

Kavousianos, X., Nikolos, D.

Year:

1999

File:

PDF, 662 KB

1999

44

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Time-division multiplexing for testing SoCs with DVS and multiple voltage islands

Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Jain, Arvind, Parekhji, Rubin

Year:

2012

Language:

english

File:

PDF, 682 KB

english, 2012

45

[IEEE 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09) - Nice (2009.04.20-2009.04.24)] 2009 Design, Automation & Test in Europe Conference & Exhibition - Generation of compact test sets with high defect coverage

Kavousianos, X., Chakrabarty, K.

Year:

2009

Language:

english

File:

PDF, 274 KB

english, 2009

46

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores

Tenentes, V., Kavousianos, X., Kalligeros, E.

Year:

2008

Language:

english

File:

PDF, 503 KB

english, 2008

47

Placement and Routing in Computer Aided Design of Standard Cell Arrays by Exploiting the Structure of the Interconnection Graph

Fudos, Ioannis, Kavousianos, Xrysovalantis, Markouzis, Dimitrios, Tsiatouhas, Yiorgos

Journal:

Computer-Aided Design and Applications

Year:

2008

Language:

english

File:

PDF, 478 KB

english, 2008

48

Time-Division Multiplexing for Testing DVFS-Based SoCs

Vartziotis, Fotis, Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Jain, Arvind, Parekhji, Rubin

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 1.52 MB

english, 2015

49

[ACM Press the conference - Munich, Germany (2008.03.10-2008.03.14)] Proceedings of the conference on Design, automation and test in Europe - DATE '08 - State skip LFSRs

Tenentes, V., Kavousianos, X., Kalligeros, E.

Year:

2008

Language:

english

File:

PDF, 338 KB

english, 2008

50

Efficient partial scan cell gating for low-power scan-based testing

Kavousianos, Xrysovalantis, Bakalis, Dimitris, Nikolos, Dimitris

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2009

Language:

english

File:

PDF, 275 KB

english, 2009

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски